X-RAY FLUORESCENCE (XRF) ANALYSIS
ANALYSIS OF ALLOYS Fe, Al, Mg, Ti, Co, Cu & Ni
XRF analysis is a non-destructive technique capable of semi-quantitative analysis, alloy ID and RoHS screening. X-rays are emitted from the miniature X-ray tube in the analyzer and strike the sample, knocking electrons out of the innermost orbitals. Electrons from outer orbitals move into the vacated spots to stabilize the newly created ion, and in the process emit energy (a secondary X-ray photon) that is characteristic to each specific element. This phenomenon is called fluorescence.
ROHS Screening of Metals and Polymers
- Total Chromium
- Total Bromi
- Total Lead
- Total Cadmium
- Total Mercury
The instrument aperture (or window) is about 5 mm in diameter (about the size of a pencil eraser). Samples as small as half this size can be individually analyzed easily, and even smaller samples can be analyzed as long as enough multiple parts are provided. Powder samples can be analyzed by placing enough powder to thoroughly cover the aperture in a clear plastic bag. Samples should be at least 5 mm thick for polymers and 1 mm thick for metal alloys to prevent the X-rays from completely penetrating through the sample.
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